Metrology software creates single-source retrofit offering.

Renishaw's new MODUS CMM software application combines with the company's UCC2 universal CMM controller and full range of sensors, including the REVO 5-axis measuring system, to form a single-source CMM retrofit package, installed and supported by the company that invented touch-trigger probes. MODUS provides a powerful platform for 5-axis measurement. Key features include CAD-driven offline programming with full simulation and collision detection of 5-axis moves; native DMIS support; certified mathematical algorithms; powerful text and graphical reporting; and flexible output of results data. Renishaw’s UCC2 universal CMM controller is supported via the I++ DME interface.

MODUS features a configurable user interface allowing native DMIS programs to be developed offline. Programs can be created directly from CAD with on-screen probe path verification. The CMM environment, the fixture and the location of the part on the machine can all be defined, enabling full simulation and crash detection of 5-axis measurement programs. This minimizes CMM downtime as programs arrive at the machine ready to run, with little or no prove-out time required.

In addition to the neutral formats of IGES, STEP, Parasolid and VDAFS, MODUS features high quality integration with CATIA (V5 and V4), Siemens NX (previously Unigraphics), Pro/E and Solidworks CAD/CAM solutions. The software also includes healing and simplification technology to optimize e CAD models. Users can select feature geometries and nominal dimensions from one or more imported CAD models, and compare measured data to CAD nominals. Product Manufacturing Information (PMI) may also be accessed from CATIA V5, Pro/E and NX models, enabling the use of embedded dimensional and tolerance information which is accessed using the MODUS planning solution module. Feature labels are maintained throughout the workflow from CAD to inspection report.

MODUS makes full use of Camio’s wide range of feature measurement and construction routines. Features include circles, lines, planes, points, cones, curves and surfaces, plus relative measurement of thin walled parts. There is also support for the construction of features, including intersections and projections. Part location and orientation techniques range from simple 3-2-1 methods to complex freeform and iterative alignments. Certified feature-fitting algorithms include least squares, minimum circumscribed, maximum inscribed and max/min. Filtering of scanned data is also supported for geometric features. Feature form is an intrinsic part of contemporary inspection techniques and MODUS’ rules-based generation of measurement paths for continuous 3-axis and 5-axis contact scanning delivers the form data required to fully analyze complex workpieces.

The reporting capability of MODUS is extensive, including traditional CMM text reports with comprehensive user-defined formatting. Graphical reporting enables results to be displayed against the CAD model, including whisker charts or 3D form plotting for many features. Results data can be output for use with third-party applications in a range of formats including Excel (CSV), ASCII text, DMIS, internet-friendly XML or directly to the Microsoft SQL Server database. Users may also customize the output file to include parameters such as the part serial number. Trend data can be displayed against a series of parts in a range of SPC charts. Users of the leading Q-DAS SPC package are fully supported with a simple, user-configurable operator’s interface from which type 1 & 2 studies can be launched.

Renishaw’s CMM retrofit solutions are based around industry standards and established technologies, maximizing flexibility for users. MODUS interfaces with Renishaw’s UCC2 universal CMM controller using the I++ DME protocol, which provides a common language for metrology commands. This leaves UCC2 users free to use other I++ DME-compliant metrology applications in the future, rather than being tied into a single proprietary solution.


www.renishaw.com


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